2, 3, 4, 202
INSPEC

Last Loaded on Web: Wednesday, July 01, 2009

Contents

Database Description
Subject Coverage
Dialog File Data
Contact
Terms and Conditions


Database Description

The Inspec databases provide over 11 million abstract and index records from more than 4,000 journals and serials, over 2,200 conference proceedings and thousands of books and book chapters, reports and dissertations. Over 20,000 U.S. and U.K. patents published between 1968 and 1976 are included.

Inspec content is drawn from quality or peer reviewed scientific and engineering literature written in any language that falls within the subject scope of the database. Approximately 12% of the source publications are in languages other than English, but all articles are abstracted and indexed in English. Author-prepared abstracts are used when available.

Inspec uses controlled vocabulary from the Inspec Thesaurus. DIALOG's online thesaurus feature is available to assist searchers in determining appropriate subject terms and codes. From January 1987 on, Inspec records also include chemical substance and numerical indexing terms. From January 1995 on, Inspec records also included astronomical object indexing terms.



Subject Coverage

Inspec consists of five subject sections, organized by Subfile.

Subfile A - Physics: elementary particles and fields, atomic, molecular and nuclear physics, phenomenology, fluids, plasmas and electric discharges, condensed matter: structure, thermal and mechanical properties, electronic structure, electrical, magnetic, and optical properties, cross-disciplinary physics and related areas, geophysics, astronomy and astrophysics

Subfile B - Electrical engineering and electronics: engineering mathematics, materials science, circuits and circuit theory, components, electron, magnetic and superconducting devices and materials, optical materials and applications, electro-optics and optoelectronics, electromagnetic fields, communications, instrumentation, power systems and applications

Subfile C - Computers and control: management topics, systems and control theory and technology, numerical analysis and theoretical computer topics, computer hardware, software and applications.

Subfile D - Information technology for business: management aspects, applications, systems and equipment, and office automation for communications and computing. Not in File 202.

Subfile E - Mechanical and production engineering: general topics in manufacturing and production engineering, manufacturing and production, engineering mechanics, and industrial sectors. Not in File 202.



Dialog File Data

Dates Covered: 1898 - present (File 2)
1969 - present (File 3)
1983 - present (File 4)
1898 - 1968 (File 202)
File Size: 11,407,599 records as of April 2009 (File 2)
10,349,878 records as of November 2008 (File 3)
8,390,360 records as of November 2008 (File 4)
873,700 records (File 202)
37,667 records from 1924 to 1988 (File 213)
Update Frequency: Weekly (File 2)
Weekly (File 3)
Weekly (File 4)
Closed (File 202)
Closed (File 213)


Contact

Inspec is provided by The Institution of Engineering and Technology. Questions concerning file content can be directed to:

Europe, Middle East, & Africa:

Inspec, The IET
Michael Faraday House
Six Hills Way
Stevenage, Hertfordshire, U.K. SG1 2AY

Telephone: +44 (0) 1438 765575
Fax: +44 (0) 1438 767339
E-Mail: inspec@theiet.org

United States:

Inspec Inc.
379 Thornall Street
Edison, NJ 08837
USA
Telephone: 1-732-321-5575
Fax: 1-732-321-5702
E-Mail: inspec@inspecinc.com

Asia Pacific:

Inspec Asia Pacific Office
4412-4413 Cosco Tower
183 Queen's Road, Central
Hong Kong,

Telephone: +852 2778 1611
Fax: +852 2778 1711
E-Mail: inspecHK@theiet.org


Terms and Conditions

ONTAP is a registered trademark of Diaog, LLC.

No special terms and conditions. For Dialog's Redistribution and Archive policy, enter HELP ERA online.


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