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Last Loaded on Web: Monday, April 01, 2013
Electronics and Communications Abstracts covers advances in the fields of electronic engineering and communications. Coverage includes theory, experiments, materials, equipment, and applications.
USE FILE 57to search for information relating to electronics and communications topics. USE /TI AND /DEfor precise subject searching: S METAL(W)VAPORS/TI,DEUSE SUBJECT CATEGORIES orSUBJECT CATEGORY CODESto narrow a search to a topic. S SH=COMPONENTS "AND" MATERIALS?S SC=20 USE RANKto find experts working in an area of interest. S DIAGNOSTIC SYSTEM?RANK AU
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Major areas of coverage include:
Literature indexed includes journal articles, conference papers, technical reports, books, monographs, standards, news briefs, and other document types as appropriate, from more than 3,000 serial and non-serial sources.
| Dates Covered: | 1981 to the present |
|---|---|
| File Size: | More than 287,000 records as of July 2005 |
| Update Frequency: | Monthly |
The following search aids are available in the Dialog Library:
CSA Electronics and Communications Abstracts Classifications (File 57)
| ACRONYM | CATEGORY NAME |
|---|---|
| EECOMP | Electrical Engineering |
| ELECTENG | Electrical Engineering |
| ENG | Engineering |
| INSTRUM | Instrumentation and Control |
| MATH | Mathematics |
| MECHENG | Mechanical Engineering |
| TELECOM | Telecommunications Technology |
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Electronics and Communications Abstracts is produced by CSA. Questions concerning file content should be directed to: 7200 Wisconsin Avenue, Suite 601 Bethesda, MD 20814
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Database copyrighted by Cambridge Scientific Abstracts (CSA). All rights reserved. Although this database was formulated with a reasonable standard of care, Cambridge Scientific Abstracts makes no representation or warranty, express or implied, as to the accuracy, completeness, merchantability, or fitness for use of the database. Except as set forth in Dialog's Electronic Redistribution and Archiving Policy, the database may not be reproduced, stored in machine-readable form, or transmitted by any means without the written permission of the publisher.
| DIALOG(R)File 57: Elect. & Comm. Abstracts | |
| (c) 2005 CSA. All rts. reserv. | |
| AA= | 0000010861 |
| IP ACCESSION NO: 200504-20-05097 | |
| /TI | X-ray diagnostics of heterostructures with quantum dots |
| AU= | Yakunin, S N; Pashaev, E M; Zaitsev, A A; Sutyrin, A G; Mokerov, V G |
| CS= | Shubnikov Institute of Crystallography, Russian Academy of Sciences, |
| Leninskii prosp. 59, 117333, Moscow, Russia | |
| JN=,SO= | Proceedings of SPIE: Micro- and Nanoelectronics 2003 (ICMNE-2003), v SPIE |
| Volume 5401, p 573-578 | |
| PY= | PUBLICATION DATE: 2004 |
| PU= | PUBLISHER: SPIE - The International Society for Optical Engineering, 1000 |
| 20th Street, P.O. Box 10, Bellingham, WA, 98225 | |
| CP= | COUNTRY OF PUBLICATION: USA |
| PUBLISHER URL: http://www.spie.org | |
| PUBLISHER EMAIL: spie@spie.org | |
| CONFERENCE: | |
| CT=,CL=,CY= | Micro - and Nanoelectronics 2003 ( ICMNE - 2003 ) , Zvenigorod, |
| Russia, 6-10 Oct. 2003 | |
| DT= | DOCUMENT TYPE: Conference Paper; Journal Article |
| RT= | RECORD TYPE: Abstract |
| LA= | LANGUAGE: English |
| BN= | ISBN: 0-8194-5324-2 |
| RN= | REPORT NO: SPIE Volume 5401 |
| NOTES: Spectra | |
| NO. OF REFS.: 17 | |
| DOI: 10.1117/12.562700 | |
| FS= | FILE SEGMENT: Electronics & Communications Abstracts |
| ABSTRACT: | |
| /AB | GaAs-based heterostructures containing the layers with InAs quantum dots |
| were studied by high-resolution X-ray diffraction and reflectivity | |
| measurements. Their structural parameters were derived by theoretical | |
| analysis of the measured data. The parameters derived from the diffraction | |
| and reflectivity measurements agree well with one another, which indicates | |
| that structural data yielded by the combination of such measurements can | |
| well be deemed plausible. | |
| /DE | DESCRIPTORS: Reflectivity; Heterostructures; Quantum dots; X ray analysis; |
| X-ray diffraction; Gallium arsenides; Indium arsenides; High resolution; | |
| Microstructure; Nanoelectronics; Semiconductors; X ray reflection | |
| Diagnostic systems; Diffraction | |
| SC=,/SH,SH= | SUBJ CATG: 20, Components and Materials (General) |
| SEARCH SUFFIX |
DISPLAY CODE |
FIELD NAME |
INDEXING |
SELECT EXAMPLES |
|---|---|---|---|---|
| None | None | All Basic Index Fields | Word | S REFLECTIVITY(W)MEASUREMENTS |
| /AB | AB | Abstract | Word | S THEORETICAL(W)ANALYSIS/AB |
| /DE | DE | Descriptor1 | Word & Phrase |
S QUANTUM(W)DOT?/DE S DIAGNOSTIC SYSTEM?/DE |
| /ID | ID | Identifier | Word & Phrase |
S EXTRUSION/ID S HEAT TRANSFER/ID |
| /SH | SH | Subject Category2 | Word | S COMPONENTS(1W)MATERIALS/SH |
| /TI | TI | Title | Word | S X(W)RAY(W)DIAGNOSTICS/TI |
2 Searchable in the Basic Index and in the Additional Indexes.
| SEARCH PREFIX |
DISPLAY CODE |
FIELD NAME |
INDEXING |
SELECT EXAMPLES |
|---|---|---|---|---|
| AA= | AA | CSA Accession Number | Phrase | S AA=200504-20-05097 |
| AU= | AU | Author | Phrase | S AU=YAKUNIN, S? |
| None | AZ | DIALOG Accession Number | ||
| BN= | BN | International Standard Book Number (ISBN) | Phrase | S BN=0-8194-5324-2 S BN=0819453242 |
| CD= | CD | Conference Date | Phrase | S CD=20031006 |
| CL= | CL | Conference Location | Word | S CL=ZVENIGOROD |
| CP= | CP | Country of Publication | Phrase | S CP=USA S CP=NEW ZEALAND |
| CS= | CS | Corporate Source | Word & Phrase |
S CS=(SHUBNIKOV(S)INSTITUTE) S CS=SHUBNIKOV INSTITUTE? |
| CT= | CT | Conference Title | Word | S CT=(MICRO(1W)NANOELECTRONICS) |
| CY= | CY | Conference Year | Phrase | S CY=2003 |
| DT= | DT | Document Type | Phrase | S DT=JOURNAL ARTICLE |
| FS= | FS | File Segment | Phrase | S FS="ELECTRONICS & COMMUNICATIONS"? |
| None | II | Digital Object Identifier | ||
| JN= | JN | Journal Name | Phrase | S JN=PROCEEDINGS OF SPIE? |
| LA= | LA | Language | Phrase | S LA=GERMAN |
| MC= | MC | Materials Classification | Phrase | S MC=ALUMINUM BASE ALLOY? |
| ML= | ML | Materials | Phrase | S ML=AL-4CU |
| NO= | NO | Document Number | Word & Phrase |
S NO=F3615 S NO=F3615-91-C-1788 |
| None | NR | Number of References | ||
| None | NT | Note | ||
| PD= | PD | Publication Date | Phrase | S PD=20040000 |
| PU= | PU | Publisher | Word | S PU=SPIE? |
| PY= | PY | Publication Year | Phrase | S PY=2004 |
| RN= | RN | Report Number | Word & Phrase |
S RN=5401 S RN=SPIE VOLUME 5401 |
| RT= | RT | Record Type | Phrase | S RT=ABSTRACT |
| SC= | SC | Subject Category | Phrase | S SC=20 |
| SH= | SH | Subject Category Text2 | Phrase | S SH="COMPONENTS AND MATERIALS"? |
| SN= | SN | International Standard Serial Number (ISSN) | Phrase | S SN=0883-2900 |
| SO= | SO | Source Information | Word | S SO=(SPIE(S)PROCEEDINGS) |
| UD= | None | Update | Phrase | S UD=9999 |
| SUFFIX | FIELD NAME | EXAMPLES |
|---|---|---|
| /ABS | Record has an Abstract | S S3/ABS |
| /NOABS | Record is a Citation Only Record | S S3/NOABS |
| /YYYY | Publication Year | S S2/2004 |
| SORTABLE FIELDS | EXAMPLES |
|---|---|
| AA, AU, CS, JN, PY, TI | SORT S3/ALL/PY/D SORT S1/ALL/TI |
| RANK FIELDS | EXAMPLES |
|---|---|
| All phrase- and numeric-indexed fields in the Additional Indexes can be ranked. | RANK DE RANK AU S4 |
| Display codes listed in the Search Options tables can be used to customize output. | TYPE S3/AU,TI/1-5 PRINT S2/TI,AB/ALL |
| NO. |
DIALOGWEB FORMAT |
RECORD CONTENT |
|---|---|---|
| 1 | -- | DIALOG Accession Number |
| 2 | -- | Full Record except Abstract |
| 3 | Medium | Bibliographic Citation |
| 4 | -- | Full Record with Tagged Fields |
| 5 | -- | Full Record |
| 6 | Short | Title and Publication Year |
| 7 | Long | Bibliographic Citation and Abstract |
| 8 | Free | Title, Indexing, and Publication Year |
| 9 | Full | Full Record |
| FIELD NAME | EXAMPLES | ||
|---|---|---|---|
| If the accession number of a specific record is known, it can be used to display the record directly. | TYPE 0000299546/5 DISPLAY 0000297006/AU,TI PRINT 0000291061/9 |
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Rates For File: Electronics and Communications Abstracts[57]
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