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Last Loaded on Web: Wednesday, May 01, 2013
The Ei Compendex® database is the machine-readable version of Engineering Index, which provides abstracted information from the world's significant engineering and technological literature. Ei Compendex provides worldwide coverage of more than 4,500 journals and selected government reports and books. Subjects include: civil, energy, environmental, geological, and biological engineering; electrical, electronics, and control engineering; chemical, mining, metals, and fuel engineering; mechanical, automotive, nuclear, and aerospace engineering; computers, robotics, and industrial robots. In addition to journal literature, there are more than 480,000 records of significant published proceedings of engineering and technical conferences formerly indexed in Ei Engineering Meetings®. The four files cover different time periods with File 8 being the most comprehensive (1884-present). ONTAP® Compendex, File 208, is available for ONline Training And Practice and contains records from 2002-2007.
USE EXPLODE (!)to search narrower and related terms: SELECT UNDERWATER STRUCTURES!USE THE ONLINE THESAURUSto check and select the thesaurus terms: EXPAND (COMPUTER APPLICATIONS)USE /MAJ LIMITto limit a search to major descriptors: SELECT SOLAR ENERGY/MAJ
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Publications from around the world are indexed, including approximately 2,600 journals, publications of engineering societies and organizations, technical reports, monographs, conferences.
The following search aids are available in the Dialog Library:
Classification Codes and Headings Used in Ei Compendex®, File 8
Descriptors and Online Thesaurus in Dialog File 8, Ei Compendex®
| ACRONYM | CATEGORY NAME |
|---|---|
| AEROSPAC | Aerospace |
| ARCHITEC | Architecture |
| AUTO | Automotive Research |
| BIOTECH | Biotechnology |
| CERAMICS | Ceramics and Composites |
| CHEMENG | Chemical Engineering |
| CIVILENG | Civil Engineering |
| COATINGS | Coatings |
| COMPOSIT | Ceramics and Composites |
| COMPSCI | Computers, Electronics, and Telecommunications R&D |
| DEFTECH | Defense Technology |
| ECOLOGY | Ecology and Conservation |
| EECOMP | Electrical Engineering |
| ELECTENG | Electrical Engineering |
| ENERGY | Energy |
| ENERGYA | Energy Files + Ei EnCompass files |
| ENERGYP | Energy Files + TULSA |
| ENG | Engineering |
| ENVIRON | Environment |
| GEOLOGY | Geology |
| GEOLOGYP | Geology + TULSA Subscriber |
| GEOSCI | Geosciences |
| INSTRUM | Instrumentation and Control |
| MANUFACT | Manufacturing |
| MATERIAL | Materials |
| MATH | Mathematics |
| MECHENG | Mechanical Engineering |
| MEDDEV | Medical Devices |
| MEDENG | Medical Engineering |
| METALS | Metals |
| METEOROL | Meteorology |
| MINING | Mining |
| NUCSCI | Nuclear Science |
| PAINTS | Paints and Coatings |
| PAPERTEC | Paper Technology |
| PETROL | Petroleum, Oil and Gas |
| PETROLA | Petroleum, Oil and Gas |
| PETROLP | Petroleum, Oil and Gas |
| PHYSICS | Physics |
| PKGTECH | Packaging Technology |
| PLASTICS | Rubber and Plastics |
| POLLUT | Pollution |
| SCITECH | Science and Technology |
| TELECOM | Telecommunications Technology |
| TEXTILE | Textiles |
| TRANSPOR | Transportation |
| WASTE | Waste Management |
| WATER | Water and Aquatic Sciences |
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Ei Compendex is produced by Elsevier Engineering Information, Inc. Questions concerning database content should be directed to: 1 Castle Point Terrace Hoboken, NJ 07030-5996
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For Dialog's Redistribution and Archive Policy, enter HELP ERA online. The following terms and conditions also apply.
Ei Compendex® (File 8): Except as authorized under Dialog's Redistribution and Archive Policy, use or copies of all or part of Ei Compendex for replacing this database, or the lease, license, or purchase of any publication listed in the Engineering Index catalog is not authorized. The use of materials supplied hereunder or any copies thereof for the purpose of loan, resale, rental use, or gift to any third person, organization or corporation is strictly forbidden. No part of Ei Compendex may be copied in machine-readable form for delivery to or made available for the use of any third party.
| DIALOG(R)File 8: Ei Compendex(R) 1884-2008/Sep W1 | |
| (c) 2008 Elsevier Eng. Info. Inc. All rights reserved. | |
| AA= | 0018211580 E.I. COMPENDEX No: 20080911114980 |
| /TI | Silica on silicon carbide |
| AU= | Presser, Volker; Nickel, Klaus G. |
| CS=,CN= | Corresp. Author/Affil: Presser, V.: Institute for Geosciences, Applied |
| Mineralogy, Eberhard Karls Universitat Tubingen, Wilhelmstr 56, D-72074 | |
| Tubingen, Germany | |
| Corresp. Author email: volker.presser@uni-tuebingen.de | |
| JN=.SO= | Critical Reviews in Solid State and Materials Sciences ( Crit Rev Solid |
| Statae Mater Sci ) (United States) 2008, 33/1 (1-99) | |
| PD=,PY= | Publication Date: 20080229 |
| PU= | Publisher: Taylor and Francis Inc. |
| SN= | ISSN: 1040-8436 eISSN: 1547-6561 |
| Publisher Item Identifier: 790590815 | |
| DOI: 10.1080/10408430701718914 | |
| DT=,RT= | Document Type: Article; Journal Record Type: Abstract |
| TC= | Treatment: L; (Literature review); X; (Experimental) |
| LA=,SL= | Language: English Summary Language: English |
| Number of References: 653 | |
| /AB | Silicon carbide (SiC) as both the most important non-oxide ceramic and |
| promising semiconductor material grows stoichiometric SiO2 as its native | |
| oxide. During passive oxidation, a surface transformation of SiC into | |
| silica takes place causing bulk volume and bulk mass increase. This review | |
| summarizes state-of-the-art information about the structural aspects of | |
| silicon carbide, silica, and SiC-SiO2 interfaces and discusses | |
| physicochemical properties and kinetics of the processes involved. A | |
| special section describes the electronic properties of carbide-oxide | |
| interfaces, which are inferior compared to Si-SiO2 interfaces, limiting the | |
| use of SiC-based electronics. In the oxidation of SiC there is a variety of | |
| parameters (e.g., porosity, presence of sintering aids, impurities, | |
| crystallographic orientation, surface treatment, and atmospheric | |
| composition) influencing the process. Therefore, the kinetics can be | |
| complex and will be discussed in detail. Nonetheless, a general | |
| linear-parabolic time-law can be found for most SiC materials for passive | |
| oxidation, thus indicating a mainly diffusion-controlled mechanism. The | |
| pronounced anisotropy of SiC expresses itself by quite different oxidation | |
| rates for the various crystallographic faces. Manifold impact factors are | |
| reflected by oxidation rate-constants for silicon carbide that vary over | |
| orders of magnitude. The understanding of SiC oxidation and silica | |
| formation is still limited; therefore, different oxidation models are | |
| presented and evaluated in the light of current knowledge. | |
| /DE | Descriptors: Growth kinetics; Oxidation; Silicon carbide; *Silica |
| /ID | Identifiers: Crystallographic faces; Oxidation rates |
| CC= | Classification Codes: |
| 801.2 (Biochemistry) | |
| 802.2 (Chemical Reactions) | |
| 804.2 (Inorganic Compounds) | |
| SEARCH SUFFIX |
DISPLAY CODE |
FIELD NAME |
INDEXING |
SELECT EXAMPLES |
|---|---|---|---|---|
| None | None | All Basic Index Fields | Word | S BULK(W)VOLUME |
| /AB | AB | Abstract | Word | S SILICON(W)CARBIDE/AB |
| /DE | DE | Descriptor1 | Word & Phrase |
S GROWTH(W)KINETICS/DE S GROWTH KINETICS/DE |
| /ID | ID | Identifier2 | Word & Phrase |
S CRYSTALLOGRAPHIC(W)FACES/ID S CRYSTALLOGRAPHIC FACES/ID |
| /TI | TI | Title3 | Word | S SILICA(1W)SILICON(W)CARBIDE/TI |
3 Does not include Conference Title, which is searchable with CT=.
| SEARCH PREFIX |
DISPLAY CODE |
FIELD NAME |
INDEXING |
SELECT EXAMPLES |
|---|---|---|---|---|
| AA= | AA | E.I. Compendex Number | Phrase | S AA=20080911114980 |
| AU= | AU | Author | Phrase | S AU=PRESSER, VOLKER |
| None | AZ | DIALOG Accession Number | ||
| BN= | BN | International Standard Book Number (ISBN)4 | Phrase | S BN=978354060 |
| CC= | CC | CAL Classification Code7 | Phrase | S CC=804.2 |
| CC= | CC | CAL Classification Heading | Word & Phrase |
S CC=(INORGANIC(W)COMPOUNDS) S CC=INORGANIC COMPOUNDS |
| CD= | CD | Conference Date | Phrase | S CD=20080407 |
| CF= | CF | E.I. Conference Number | Phrase | S CF=72154 |
| CL= | CL | Conference Location | Word | S CL=(SCHAUMBURG(W)IL) |
| CO= | CO | CODEN | Phrase | S CO=KERTA |
| CS= | CS | Corporate Source | Word | S CS=(INSTITUTE(1W)GEOSCIENCES(F)TUBINGEN) |
| CT= | CT | Conference Title5 | Word | S CT=(49TH(W)AIAA(W)ASME(W)ASCE(W)AHS)) |
| CY= | CY | Conference Year | Phrase | S CY=2008 |
| DT= | DT | Document Type | Phrase | S DT=ARTICLE |
| JN= | JN | Journal Name5 | Phrase | S JN=CRITICAL REVIEWS IN SOLID STATE? |
| LA= | LA | Language | Phrase | S LA=ENGLISH |
| PD= | PD | Publication Date | Phrase | S PD=20080229 |
| PU= | PU | Publisher | Word | S PU=(TAYLOR(1W)FRANCIS) |
| PY= | PY | Publication Year | Phrase | S PY=2008 |
| RN= | RN | IEEE Conference Proceeding Number | Word | S RN=IEEE 99-00031 |
| RT= | RT | Record Type | Phrase | S RT=ABSTRACT |
| SL= | SL | Summary Language | Phrase | S SL=ENGLISH |
| SN= | SN | International Standard Serial Number (ISSN) | Phrase | S SN=1040-8436 S SN=10408436 |
| SO= | SO | Source Information6 | Word | S SO=(CRITICAL(W)REVIEWS(F)MATERIALS) |
| SP= | SP | Conference Sponsor | Word | S SP=AIAA |
| TC= | TC | Treatment Code | Phrase | S TC=L |
| UD= | None | Update | Phrase | S UD=9999 |
4 Available only for records from January 1985 forward.
6 Search and Display, depending on document type, may include: Conference Title, Conference Location, Conference Sponsor, Conference Date, Journal Name, Publication Year, Report Number, Volume, and Pagination.
7 Truncate the code for the complete retrieval.
| SUFFIX | FIELD NAME | EXAMPLES |
|---|---|---|
| /ENG | English Language | S DT=BOOK/ENG |
| /MAJ | Major Descriptor | S SILICA/MAJ |
| /NONENG | Non-English Language | S S1/NONENG |
| /YYYY | Publication Year | S SILICON(W)CARBIDE/2007:2008 |
| SORTABLE FIELDS | EXAMPLES |
|---|---|
| AA, AU, CD, CS, CT, JN, PY, TI | SORT S3/ALL/JN SORT S2/ALL/PY/D |
| RANK FIELDS | EXAMPLES |
|---|---|
| All phrase- and numeric-indexed fields in the Additional Indexes can be ranked. Other RANK codes include: CS, DE, ID | RANK DE RANK AU S4 |
| Display codes listed in the Search Options tables can be used to customize output. | TYPE S3/AU,TI,SO/1-5 PRINT S2/TI, CS, PY/ALL |
| NO. |
DIALOGWEB FORMAT |
RECORD CONTENT |
|---|---|---|
| 1 | -- | DIALOG Accession Number |
| 2 | -- | Full Record except Abstract |
| 3 | Medium | Bibliographic Citation |
| 4 | -- | Full Record with Tagged Fields |
| 5 | -- | Full Record |
| 6 | Short | Title and Publication Year |
| 7 | Long | Full Record except Indexing |
| 8 | Free | Title, Indexing, and Publication Year |
| 9 | Full | Full Record |
| K | -- | KWIC (Key Word In Context) displays a window of text; may be used alone or with other formats |
| FIELD NAME | EXAMPLES | ||
|---|---|---|---|
| If the accession number of a specific record is known, it can be used to display the record directly. | TYPE 1082931/5 DISPLAY 1029361/AU,TI PRINT 1020671/9 |
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501-1000 8.00
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