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2, 3, 4, 202
INSPEC
ONTAP® INSPEC (FILE 213)

Last Loaded on Web: Tuesday, October 01, 2013

Last Update To Bluesheet: April 1, 2009

Bluesheet Contents     PDF version

File Description Dialog File Data Special Features Sample Record Sort
Subject Coverage Related Search Aids DIALINDEX/OneSearch Categories Basic Index Rank
Tips Document Types Indexed Contact Additional Indexes Predefined Format Options
Print Counterparts Geographic Coverage Terms and Conditions Limit Rates


File Description [top]

The Inspec databases provide more than 11 million abstract and index records from more than 4,000 journals and serials, more than 2,200 conference proceedings and thousands of books and book chapters, reports and dissertations. More than 20,000 U.S. and U.K. patents published between 1968 and 1976 are included.

Inspec content is drawn from quality or peer reviewed scientific and engineering literature written in any language that falls within the subject scope of the database. Approximately 12% of the source publications are in languages other than English, but all articles are abstracted and indexed in English. Author-prepared abstracts are used when available.

Inspec uses controlled vocabulary from the Inspec Thesaurus. DIALOG's online thesaurus feature is available to assist searchers in determining appropriate subject terms and codes. From January 1987 on, Inspec records also include chemical substance and numerical indexing terms. From January 1995 on, Inspec records also included astronomical object indexing terms.



Tips [top]

USE EXPLODE (!)

to search narrower and related terms:

     S OPTICAL FIBRES!

USE THE ONLINE THESAURUS

to check and select the thesaurus terms:

     EXPAND (SOLID LASERS)

USE RANK

to find additional descriptors:

     SELECT SEEBECK EFFECT
     RANK DE

USE LIMITS

to narrow subject coverage:

     /PHYS for Physics Subfile A
     /TECH for other Subfiles


Subject Coverage [top]

Inspec consists of five subject sections, organized by Subfile.

Subfile A - Physics: elementary particles and fields, atomic, molecular and nuclear physics, phenomenology, fluids, plasmas and electric discharges, condensed matter: structure, thermal and mechanical properties, electronic structure, electrical, magnetic, and optical properties, cross-disciplinary physics and related areas, geophysics, astronomy and astrophysics

Subfile B - Electrical engineering and electronics: engineering mathematics, materials science, circuits and circuit theory, components, electron, magnetic and superconducting devices and materials, optical materials and applications, electro-optics and optoelectronics, electromagnetic fields, communications, instrumentation, power systems and applications

Subfile C - Computers and control: management topics, systems and control theory and technology, numerical analysis and theoretical computer topics, computer hardware, software and applications.

Subfile D - Information technology for business: management aspects, applications, systems and equipment, and office automation for communications and computing. Not in File 202.

Subfile E - Mechanical and production engineering: general topics in manufacturing and production engineering, manufacturing and production, engineering mechanics, and industrial sectors. Not in File 202.



Print Counterparts [top]

  • Computer and Control Abstracts
  • Physics Abstracts
  • Electrical and Electronics Abstracts


Dialog File Data [top]

Dates Covered: 1898 - present (File 2)
1969 - present (File 3)
1983 - present (File 4)
1898 - 1968 (File 202)
File Size: 12.7M records as of March 2011 (File 2)
11.8M records as of March 2011 (File 3)
9.87M records as of March 2011 (File 4)
873,700 records (File 202)
37,667 records from 1924 to 1988 (File 213)
Update Frequency: Weekly (File 2)
Weekly (File 3)
Weekly (File 4)
Closed (File 202)
Closed (File 213)


Related Search Aids [top]

The following search aids are available in the Dialog Library:



Document Types Indexed [top]

  • Reports
  • Book Chapters
  • Books and Monographs
  • Conferences, Symposia, Meetings
  • Journal Articles
  • Theses and Dissertations
  • Patents
  • Standards


Geographic Coverage [top]

  • International


Geographic Restrictions [top]

  • None


Special Features [top]

  • ERA Available
  • Graduate Education Program
  • KWIC and HILIGHT Available
  • DIALOG Alert Available
  • Remove Duplicates (RD, ID) Available
  • CURRENT Feature Available
  • Online Thesaurus


DialIndex/OneSearch Categories [top]

ACRONYM CATEGORY NAME
AEROSPAC Aerospace
ASTRON Astronomy
CERAMICS Ceramics and Composites
CHEMENG Chemical Engineering
CHEMLIT Chemical Literature
COMPOSIT Ceramics and Composites
COMPSCI Computers, Electronics, and Telecommunications R&D
DEFTECH Defense Technology
EECOMP Electrical Engineering
ELECTENG Electrical Engineering
ENERGY Energy
ENERGYA Energy Files + Ei EnCompass files
ENERGYP Energy Files + TULSA
ENG Engineering
GEOPHYS Geophysics
GEOSCI Geosciences
INFOSCI Library and Information Services
INSTRUM Instrumentation and Control
MANUFACT Manufacturing
MATERIAL Materials
MATH Mathematics
MEDDEV Medical Devices
MEDENG Medical Engineering
METALS Metals
METEOROL Meteorology
NUCSCI Nuclear Science
PAPERTEC Paper Technology
PHYSICS Physics
PLASTICS Rubber and Plastics
SCITECH Science and Technology
TELECOM Telecommunications Technology
TRANSPOR Transportation


Contact [top]

Inspec is provided by The Institution of Engineering and Technology. Questions concerning file content can be directed to:

Europe, Middle East, & Africa:

Inspec, The IET
Michael Faraday House
Six Hills Way
Stevenage, Hertfordshire, U.K. SG1 2AY

Telephone: +44 (0) 1438 765575
Fax: +44 (0) 1438 767339
E-Mail: inspec@theiet.org

United States:

Inspec Inc.
379 Thornall Street
Edison, NJ 08837
USA
Telephone: 1-732-321-5575
Fax: 1-732-321-5702
E-Mail: inspec@inspecinc.com

Asia Pacific:

Inspec Asia Pacific Office
4412-4413 Cosco Tower
183 Queen's Road, Central
Hong Kong,

Telephone: +852 2778 1611
Fax: +852 2778 1711
E-Mail: inspecHK@theiet.org


Terms and Conditions [top]

ONTAP is a registered trademark of Diaog, LLC.

No special terms and conditions. For Dialog's Redistribution and Archive policy, enter HELP ERA online.

The Institution of Engineering and Technology is registered as a Charity in England & Wales (no 211014) and Scotland (no SC038698).


Dialog Standard Terms & Conditions apply.


SAMPLE JOURNAL PAPER RECORD [top]

     
    INSPEC 
    (c)2009 Institution of Engineering & Technology. All rights reserved. 
     
  AZ=  11506571 
  /TI  Title: Thermoelectric properties of p-type Fe2(V1-x-yTixTay) Al alloys 
  AU=  Author(s):  Mori, T.; Ide, N.; Nishino, Y. 
  CS=  Author Affiliation:  Dept. of Mater. Sci. & Eng., Nagoya Inst. of 
    Technol., Nagoya, Japan 
  JN=,VL=  Journal: Journal of the Japan Institute of Metals, vol.72, 
  NO=,PP=  no.8, pp.593-8 
  PU=  Publisher:  Aboba Aramaki 
  CP=  Country of Publication:  Japan 
  PD=  Publication Date:  Aug. 2008 
  SN=  ISSN:  0021-4876 
  CO=  CODEN:  NIKGAV 
    Item Identifier (DOI): http://dx.doi.org/10.2320/jinstmet.72.593 
  LA=  Language: Japanese 
  DT=  Document Type:  Journal Paper (JP) 
  TC=  Treatment:  Experimental (X) 
  /AB  Abstract:  We report on the temperature dependence of the electrical 
    resistivity and the Seebeck coefficient for the p-type Fe2(V1-x-yTixTay)Al 
    alloys with compositions 02VAl (x = 0, y = 0) exhibits a (...) 
  NR=  ( 20 refs.) 
  SF=  Subfile(s):  A (Physics) 
  /DE,/DF  Descriptors: aluminium alloys; doping; electrical resistivity; 
    iron alloys; Seebeck effect; tantalum alloys; thermal conductivity; 
    titanium alloys; vanadium alloys 
  /ID,/IF  Identifiers: thermoelectric properties; p-type alloys; electrical 
    resistivity; Seebeck coefficient; lattice thermal conductivity; (...) 
  CC=  Classification Codes: A7215J (Thermoelectric effects (metals/alloys)); 
    A6170T (Doping and implantation of impurities); A7215E (Electrical 
    and thermal conduction in crystalline metals and alloys) 
  CI=  Chemical Indexing: 
    Fe2VTiTaAl/ss - Fe2/ss - Al/ss - Fe/ss - Ta/ss - Ti/ss - V/ss 
  NI=, TE=  Numerical Indexing:  temperature: 2.93E+02 to 2.98E+02 K 
  UI=  INSPEC Update Issue:  2009-013 
    Copyright: 2009, The Institution of Engineering and Technology 
     

SAMPLE TRANSLATION JOURNAL RECORD

     
  AZ=  08819672 
  /TI  Title: Controlled magnetoresistance in Y3/4Lu1/4Ba 2Cu3O7-CuO composites at 77K 
  AU=  Author(s): Balaev, D.A.; Shaihutdinov, K.A.; Popkov, S.I.; Petrov, M.I. 
  CS=  Author Affiliation: Kirensky Inst. of Phys., Russian Acad. of Sci., 
    Krasnoyarsk, Russia 
  JN=,VL,NO=  Journal: Pis'ma v Zhurnal Tekhnicheskoi Fizika, vol.29, no.7 
  CP=  Country of Publication: Russia 
  PD=  Publication Date: July 2003 
  SN=  ISSN: 0320-0116 
  CO=  CODEN: PZTFDD 
  JN=  Translation Journal: Technical Physics Letters, pp.578-81 
  PU=  Publisher of Translation Journal: MAIK Nauka 
  CP=  Country of Publication of Translation Journal: Russia 
  CO=  CODEN of Translation Journal: TPLEED 
  SN=  ISSN of Translation Journal: 1063-7850 
    U.S. Copyright Clearance Center Code of Translation Journal: 
    1063-7850/03/2907-0578$24 
  UR=  URL of Translation Journal: HTTP://OJPS.AIP.ORG/DBT/DBT.JSP 
    DOI of Translation Journal: http://dx.doi.org/10.1134/1.1598555 
  LA=  Language: English 
  DT=  Document Type: Journal Paper Translation Abstracted (JP) 
  TC=  Treatment: Experimental (X) 
  /AB  Abstract: We have studied the low-temperature magnetoresistance of 
    Y3/4 Lu1/4Ba2Cu3O7-CuO composites obtained by fast sintering technique 
  NR=   (...) ( 17 refs.) 
  SF=  Subfile(s): A (Physics) 
  /DE,/DF  Descriptors: barium compounds; composite superconductors; critical 
    current compounds; magnetic sensors; magnetoresistance; sintering; 
    yttrium compounds 
  ID,IF  Identifiers: controlled magnetoresistance; composites; fast sintering; 
    critical current density; electric resistance; threshold value; magnetic 
    field strength; (...) 
  CC=  Classification Codes:  A7430F (Transport properties of superconductors); 
    A7430C (Magnetic properties of superconductors); A7470V (Perovskite phase 
    superconductors); (...) 
  CI=  Chemical Indexing: 
     Y0.75Lu0.25Ba2Cu3O7CuO/ss - Lu0.25/ss - Y0.75/ss - Ba2/ss - Cu3/ss - 
    Ba/ss - Cu/ss - Lu/ss - O7/ss - O/ss - Y/ss 
  NI,TE=  Numerical Indexing: temperature: 7.7E+01 K 
  UI=  INSPEC Update Issue: 2004-001 
    Copyright: 2004, IEE 
     

SAMPLE CONFERENCE PROCEEDINGS RECORD

     
  AZ=  11478910 
  /TI  Title: Third International Conference on Digital Society. ICDS 2009  
  PU=  Publisher:  IEEE,  Piscataway, NJ 
  CP=  Country of Publication:  USA 
  PD=  Publication Date: 2009 
  CT=  Conference Title: Third International Conference on Digital Society. 
    ICDS 2009 
  CY=  Conference Date:  1-7 Feb. 2009 
  CL=  Conference Location: Cancun, Mexico 
  SP=  Conference Sponsor: IARIA 
  AU=  Editor(s): Takahashi, Y.; Berntzen, L.; Smedberg, A. 
  BN=  ISBN: 978-0-7695-3526-5 
    U.S. Copyright Clearance Center Code: 978-0-7695-3526-5/09/$25.00 
  LA=  Language: English 
  DT=  Document Type:  Conference Proceedings  (CP) 
  /AB  Abstract: The following topics are dealt with: e-government services; 
    radio networks; Internet; Web services; electronic commerce; e-defense; 
    software engineering; intelligent computation; digital analysis, and 
    digital processing. (0 refs.) 
  SF=  Subfile(s): B (Electrical & Electronic Engineering); C (Computing & 
    Control Engineering) 
  /DE,/DF  Descriptors: government; Internet; radio networks; software engineering; 
    Web services 
  /ID,/IF  Identifiers: e-government services; radio networks; Internet; Web services; 
    electronic commerce; e-defense; software engineering; intelligent (...) 
  CC=, CN=  Classification Codes: B0100 (General electrical engineering topics); B6250 
    (Radio links and equipment); C0000 (General and management topics); 
    C6110B (Software engineering techniques); (...) 
  UI=  INSPEC Update Issue: 2009-011 
    Copyright:  2009, The Institution of Engineering and Technology 
     


BASIC INDEX [top]

SEARCH
SUFFIX
DISPLAY
CODE
FIELD NAME
INDEXING
SELECT EXAMPLES
None None All Basic Index Fields Word S FAST(W)SINTERING
/AB AB Abstract Word S (FISSION(W)PRODUCTS)/AB
/DE DE Descriptor1 Word
& Phrase
S (SEEBECK(W)EFFECT)/DE
S BARIUM COMPOUNDS/DE
S ENERGY GAP/DF
/IC IC IPC8 Text Word S (PROCESSES(1W)FILTRATION)/IC
/ID ID Identifier2,3 Word
& Phrase
S (P(W)TYPE(W)ALLOYS)/ID
S THRESHOLD VALUE/ID
S THRESHOLD VALUE/IF
/TI TI Title Word S (AL(W)ALLOYS)/TI

1 Also /DF.

2 Also /IF.

3 Includes astronomical object indexing.


ADDITIONAL INDEXES [top]

SEARCH
PREFIX
DISPLAY
CODE
FIELD NAME
INDEXING
SELECT EXAMPLES
AC= AC Patent Application Country4 Phrase S AC=USA
AD= AD Patent Application Date4 Phrase S AD=19700818
AN= AN Patent Application Number4 Phrase S AN=US 64758
S AN=A10806/68
AU= AU Author Phrase S AU=MORI, T.
AV= AV Availability5 Word S AV=(UNIV(W)MICROFILMS)
AZ= AZ DIALOG Accession Number Phrase S AZ=11506571
BN= BN International Standard Book Number (ISBN)5 Phrase S BN=978-1-4244-2838-0
S BN=9781424428380
CC= CC Classification Code Phrase S CC=A6855
CL= CL Conference Location6 Word S CL=(SANTIAGO(2W)COMPOSTELA)
S CL=SPAIN
CN= CN Classification Name Word
& Phrase
S CN=(FILM AND EPITAXY)
S CN=BETA DECAY?
CO= CO CODEN5 Phrase S CO=TPLEED
CP= CP Country of Publication Word
& Phrase
S CP=(SOUTH(W)AFRICA)
S CP=RUSSIA
CR= CR Cited References5,17 Phrase S CR=SOLAR CELLS?
CS= CS Corporate Source Word
& Phrase
S CS=(NAGOYA(3W)TECH?)
S CS=UNIWERSYTET WROCLAWSKI?
CT= CT Conference Title6 Word S CT=(ELECTRON(W)DEVICES)
CY= CY Conference Date6,7 Phrase S CY=20090211
S CY=(20090211 AND 20090213)
DN= DN Document Number5 Phrase S DN='S 0010-4655(01)00314-9'
DT= DT Document Type Phrase S DT=JOURNAL PAPER
S DT=JP
None EL Author Email Address
IC= IC IPC8 Code5 Phrase S IC="B01D-0037/00"
None II Digital Object Identifier
JN= JN Journal Name8 Phrase S JN=PIS?MA V ZHURNAL TEKH?
LA= LA Language Phrase S LA=ENGLISH
NI= NI Numeric Information9,10 Phrase S NI=TEMPERATURE
NO= SO Issue Number11 Phrase S NO=7
NR= NR Number of References12 Numeric S NR=17
PA= PA Patent Assignee4 Word
& Phrase
S PA=(ACRON(W)CORP)
S PA=ACRON CORP?
PC= PC Patent Country4 Phrase S PC=USA
PD= PD Publication Date, Patent Publication Date13 Phrase S PD=20080800
PN= PN Patent Number4 Phrase S PN=US 3703607
PP= SO Pagination11 Phrase S PP=593-8
PU= PU Publisher Word S PU=(ABOBA(W)ARAMAKI)
PY= PY Publication Year14 Phrase S PY=2008
RN= RN Report or Contract Number Word
& Phrase
S RN=(JAEA(3W)2007)
S RN=JAEA-RESEARCH 2007-068
SF= SF Subfile Phrase S SF=A
None SI Z39.56 Serial Item Contribution Identifier Code
SN= SN International Standard Serial Number (ISSN)5 Phrase S SN=0021-4876
S SN=00214876
SO= SO Source Information Word S SO=(IEEE(F)LETTERS and 4)
SP= SP Conference Sponsor Word S SP=IARIA
TC= TC Treatment Code5 Phrase S TC=PRACTICAL
S TC=P
UD= None Dialog File Update Phrase S UD=9999
UI= UI Inspec Update Issue15 Phrase S UI=2009-011
UR= UR Uniform Resource Locator (URL)5 Phrase S UR="HTTP://OJPS.AIP.ORG/"?
VL= SO Volume of publication11 Phrase S VL=29
CHEMICAL INDEXING FIELDS (available since January 1987)16
CI= CI Substance (including role modifier)16 Word
& Phrase
S CI=SI-AL-AU INT
S CI=(SI(S)AL(S)AU)
NUMERICAL INDEXING FIELDS (available since January 1987)9,10
HI= None Highest value9,10 Word
& Phrase
S HI=2.5E4(S)NI=FREQUENCY
S HI<=9.7E-7(S)NI=WAVELENGTH
LO= None Lowest value9,10 Word
& Phrase
S LO=100(S)NI=TEMPERATURE
S LO>=3.16E7(S)NI=AGE
NUMERICAL INDEXING FIELDS (available since January 1987)10
AG= NI Age (yr; Year) Numeric S AG=0:5
S AG>=1E9
AL= NI Altitude (m; Meter) Numeric S AL=2E4:9E5
S AL=>20000
AP= NI Apparent Power (VA; Volt-amp) Numeric S AP=3E6
BI= NI Bit Rate (Bit/s; Bits per Second) Numeric S BI=64000
BW= NI Bandwidth (Hz; Hertz) Numeric S BW=0.3:260
S BW=5E7
BY= NI Byte Rate (Byte/s; Bytes per Second) Numeric S BY=2.5E6
CA= NI Capacitance (F; Farad) Numeric S CA=2E-13
CD= NI Conductance (S; Seimen) Numeric S CD=2:5
CE= NI Computer Execution Rate (IPS; Instructions/Second) Numeric S CE>=1E6
CM= NI Computer Speed (FLOPS) Numeric S CM>=3.5E6
CU= NI Current (A; Ampere) Numeric S CU=0.051
DI= NI Distance (m; Meter) Numeric S DI=0.002
DP= NI Depth (m; Meter) Numeric S DP=2E4:9E5
EF= NI Efficiency (Percent) Numeric S EF=60
EL= NI Electrical Conductivity (S/m; Siemen per Meter) Numeric S EL=7.0E4
EN= NI Energy (J; Joule) Numeric S EN=0.5
ER= NI Electrical Resistivity (ohmm; Ohm meter) Numeric S ER=1.7E-4
S ER=0.00017
EV= NI Electron Volt Energy (eV; Electron Volt) Numeric S EV=-0.5:0
FR= NI Frequency (Hz; Hertz) Numeric S FR=0:1
GA= NI Gain (dB; Decibel) Numeric S GA=14
GD= NI Galactic Distance (pc; Parsec) Numeric S GD>=10000000
S GD>=1E7
GE= NI Geocentric Distance (m; Meter) Numeric S GE=>3.7E10
HD= NI Heliocentric Distance (AU; Astronomical Unit) Numeric S HD=5E1
S HD=1.0:9.0E1
LS= NI Loss (dB; Decibel) Numeric S LS=-60:0
MA= NI Mass (kg; Kilogram) Numeric S MA=500
S MA=5E2
MD= NI Magnetic Flux Density (T; Tesla) Numeric S MD=1E-2
S MD=2
MS= NI Memory Size (Byte) Numeric S MS>=3E7
NF= NI Noise Figure (dB; Decibel) Numeric S NF=1:2
PO= NI Power (W; Watt) Numeric S PO=4E-5:2E-4
PR= NI Pressure (Pa; Pascal) Numeric S PR=1.3E-3
PS= NI Printer Speed (cps; Characters per Second) Numeric S PS>=2E2
PX= NI Picture Size (pixel; Picture Element) Numeric S PX=512
RA= NI Radiation Absorbed Dose (Gy; Gray) Numeric S RA=2
S RA=0:4.0
RD= NI Radiation Dose Equivalent (Sv; Sievert) Numeric S RD=1E-6:1E-2
RE= NI Resistance (ohm) Numeric S RE=7E-5:0.1
RP= NI Reactive Power (VAr; Volt-Amp Reactive) Numeric S RP=1E5
RX= NI Radiation Exposure (C/kg; Coulomb per Kilogram) Numeric S RX<=0.1
S RX=2.58E-1:1.29
RY= NI Radioactivity (Bq; Becquerel) Numeric S RY=1E8:1E12
SI= NI Size (m; Meter) Numeric S SI=0.7:15
SM= NI Stellar Mass (Msol; Solar Mass) Numeric S SM=1E-2:3000
SR= NI Storage Capacity (Bit) Numeric S SR=4.2E6
TE= NI Temperature (K; Kelvin) Numeric S TE=3.26E2
TM= NI Time (s; Second) Numeric S TM=2E-11:4E-11
VE= NI Velocity (m/s; Meters per Second) Numeric S VE=500:1000
S VE=5E2:1E3
VO= NI Voltage (V; Volt) Numeric S VO>=1000
S VO>=1E03
WA= NI Wavelength (m; Meter) Numeric S WA=8.8E-7:1E-1
WL= NI Word Length (Bit) Numeric S WL=32

4 Patent records only.

5 Not in File 202.

6 Use CF display code for conference details.

7 CY= conference start and end dates as YYYYMMDD.

8 Searchable as full or abbreviated name; displays full name.

9 Use LO= and HI= to specify minimum or maximum values. Qualify HI= or LO= searches by adding the desired quantity using the NI= prefix. The smallest and largest searchable numbers are 5.4E-79 and 7.2E+75.

10 Numeric data is indexed into separate numeric fields; see the Numerical Indexing Fields section. Each quantity and its matching abbreviated unit of measure are also searchable using NI=. Truncation is not allowed when searching numeric data; range searching is recommended.

11 Volume (VL=), Issue (NO=), and Page (PP=) details are also Word parsed into the SO index, and are displayed using SO.

12 Not available for RANK.

13 PD= Publication Date and Patent Publication Date as YYYMMDD. To isolate patent records use S DT=Patent.

14 PY= Publication Year does not include patent records. For Patent Publication Date see PD=.

15 UI= Inspec Update Issue is the year and Inspec issue number in which the record was released by Inspec.

16 Role modifiers include: EL (element), DOP (dopant), BIN (binary system), SS (system with 3 or more components), INT (interface system), SUR (surface or substrate), ADS(adsorbate, or any sorbate).

17 Only Cited References are searchable, not cited author, year, or work


LIMIT [top]

SUFFIX FIELD NAME EXAMPLES
/ART Journal Article S S2/ART
/ENG English Language S S9/ENG
/NAR Non-Journal Article S AMPLIFIER?/NAR
/NONENG Non-English Language S LASERS/NONENG
/PHYS Physics Subfile S SEMICONDUCTOR?/PHYS
/TECH Electronics, Computing, and Information Technology Subfiles S HOLOGRAPHY/TECH
/YYYY Publication Year S STELLAR?/2005:2006


SORT [top]

SORTABLE FIELDS EXAMPLES
AU, AZ, CC, CS, CY, JN, NR, PD, PY, TI SORT S3/ALL/JN,D
SORT S4/ALL/AU


RANK [top]

RANK FIELDS EXAMPLES
All phrase- and numeric-indexed fields in the Additional Indexes can be ranked. Other RANK codes include: DE RANK ID S2
RANK AU S1


USER-DEFINED FORMAT OPTIONS [top]

Display codes listed in the Search Options table can be used to customize output. TYPE S3/AU,TI,SO/1-5
TYPE S2/TI, AB/ALL


PREDEFINED FORMAT OPTIONS [top]

NO.
DIALOGWEB
FORMAT
RECORD CONTENT
1 -- DIALOG Accession Number
2 -- Full Record except Abstract
3 Medium Bibliographic Citation
4 -- Full Record with Tagged Fields
5 -- Full Record
6 Short Title and Publication Date
7 Long Full Record except Indexing
8 Free Title, Indexing, and Publication Date
9 Full Full Record
K -- KWIC (Key Word In Context) displays a window of text; may be used alone or with other formats


DIRECT RECORD ACCESS [top]

FIELD NAME EXAMPLES
If the accession number of a specific record is known, it can be used to display the record directly. TYPE 9581561/5
DISPLAY 9574895/5
PRINT 4764942/3


Rates [top]

Rates For File: Inspec (1898-present)[2]
Cost per DialUnit:                $15.00
Cost per minute:                   $3.13
Rank Elements                      $0.00
ALERT (default)                    $5.00
ALERT (Monthly)                   $14.75
ALERT (Biweekly/twice a month) *   $9.25
ALERT (Weekly)                     $5.00
ALERT (Daily)                  *   $5.00
ALERT (Calendar weekly)        *   $5.00
ALERT (Intraday)               *   $5.00
* = custom scheduled Alerts only
ALERT Number of included prints        0

Format    Types   Prints
     1    $0.00    $0.00
     2    $4.75    $4.75
     3    $4.75    $4.75
     4    $4.75    $4.75
     5    $4.75    $4.75
     6    $0.00    $0.00
     7    $4.75    $4.75
     8    $0.00    $0.00
     9    $4.75    $4.75
KWIC95    $0.30       NA
KWIC96    $0.30       NA

REDIST/COPY Multiplier Table:

      Range      Multiplier
        1-2       1.00
       3-25       1.50
     26-100       3.00
    101-200       4.00
    201-500       6.00
   501-1000       8.00
 1001 or more    10.00

ARCHIVE Multiplier Table:

      Range      Multiplier
       1-25       1.50
     26-200       3.00
    201-500       6.00
   501-1000       8.00
 1001 or more    10.00
Rates For File: Inspec (1969-present)[3]
Cost per DialUnit:                $15.00
Cost per minute:                   $3.13
Rank Elements                      $0.00
ALERT (default)                    $5.00
ALERT (Monthly)                   $14.75
ALERT (Biweekly/twice a month) *   $9.25
ALERT (Weekly)                     $5.00
ALERT (Daily)                  *   $5.00
ALERT (Calendar weekly)        *   $5.00
ALERT (Intraday)               *   $5.00
* = custom scheduled Alerts only
ALERT Number of included prints        0

Format    Types   Prints
     1    $0.00    $0.00
     2    $4.75    $4.75
     3    $4.75    $4.75
     4    $4.75    $4.75
     5    $4.75    $4.75
     6    $0.00    $0.00
     7    $4.75    $4.75
     8    $0.00    $0.00
     9    $4.75    $4.75
KWIC95    $0.30       NA
KWIC96    $0.30       NA

REDIST/COPY Multiplier Table:

      Range      Multiplier
        1-2       1.00
       3-25       1.50
     26-100       3.00
    101-200       4.00
    201-500       6.00
   501-1000       8.00
 1001 or more    10.00

ARCHIVE Multiplier Table:

      Range      Multiplier
       1-25       1.50
     26-200       3.00
    201-500       6.00
   501-1000       8.00
 1001 or more    10.00
Rates For File: Inspec (1983-present)[4]
Cost per DialUnit:                $15.00
Cost per minute:                   $3.13
Rank Elements                      $0.00
ALERT (default)                    $5.00
ALERT (Monthly)                   $14.75
ALERT (Biweekly/twice a month) *   $9.25
ALERT (Weekly)                     $5.00
ALERT (Daily)                  *   $5.00
ALERT (Calendar weekly)        *   $5.00
ALERT (Intraday)               *   $5.00
* = custom scheduled Alerts only
ALERT Number of included prints        0

Format    Types   Prints
     1    $0.00    $0.00
     2    $4.75    $4.75
     3    $4.75    $4.75
     4    $4.75    $4.75
     5    $4.75    $4.75
     6    $0.00    $0.00
     7    $4.75    $4.75
     8    $0.00    $0.00
     9    $4.75    $4.75
KWIC95    $0.30       NA
KWIC96    $0.30       NA

REDIST/COPY Multiplier Table:

      Range      Multiplier
        1-2       1.00
       3-25       1.50
     26-100       3.00
    101-200       4.00
    201-500       6.00
   501-1000       8.00
 1001 or more    10.00

ARCHIVE Multiplier Table:

      Range      Multiplier
       1-25       1.50
     26-200       3.00
    201-500       6.00
   501-1000       8.00
 1001 or more    10.00
Rates For File: Inspec (1898-1968)[202]
Cost per DialUnit:                $15.00
Cost per minute:                   $3.13

Format    Types   Prints
     1    $0.00    $0.00
     2    $4.75    $4.75
     3    $4.75    $4.75
     4    $4.75    $4.75
     5    $4.75    $4.75
     6    $0.00    $0.00
     7    $4.75    $4.75
     8    $0.00    $0.00
     9    $4.75    $4.75
KWIC95    $0.30       NA
KWIC96    $0.30       NA

REDIST/COPY Multiplier Table:

      Range      Multiplier
        1-2       1.00
       3-25       1.50
     26-100       3.00
    101-200       4.00
    201-500       6.00
   501-1000       8.00
 1001 or more    10.00

ARCHIVE Multiplier Table:

      Range      Multiplier
       1-25       1.50
     26-200       3.00
    201-500       6.00
   501-1000       8.00
 1001 or more    10.00
Rates For File: ONTAP® Inspec[213]
Cost per DialUnit:                 $0.00
Cost per minute:                   $0.00
Report Elements                    $0.00
LOB Reports                        $0.00
SHARE Reports                      $0.00
CROSSTAB Report Records            $0.00
Rank Elements                      $0.00

Format    Types   Prints
     1    $0.00    $0.00
     2    $0.00       NA
     3    $0.00    $0.00
     4    $0.00    $0.00
     5    $0.00    $0.00
     6    $0.00    $0.00
     7    $0.00    $0.00
     8    $0.00    $0.00
     9    $0.00    $0.00
KWIC95    $0.00       NA

REDIST/COPY Multiplier Table:
      Range      Multiplier
        1-2       1.00
       3-25       1.50
     26-100       3.00
    101-200       4.00
    201-500       6.00
   501-1000       8.00
 1001 or more    10.00

ARCHIVE Multiplier Table:

      Range      Multiplier
       1-25       1.50
     26-200       3.00
    201-500       6.00
   501-1000       8.00
 1001 or more    10.00
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